Features | Benefits |
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- Epi p/p- product provides a defect-free layer for device fabrication
| - Cost effective replacement for N-doped epi, annealed or advanced polished wafers offering the advantages of a mature technology
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- No harmful crystal defects in the epi layer
| - No crystal-defect related yields and reliability degradation
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- Deep precipitate-free zone maintained throughout customer processing
| - Improved device yield and reliability potential by eliminating all oxygen precipitates in device layer
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- Deep precipitate-free zone maintained throughout customer processing
| - Improved device yield and reliability potential by eliminating all oxygen precipitates in device layer
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- Robust IG protection through MDZ®
| - Insurance against device yield upsets caused by metallic contamination
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- Build-in IG template through MDZ® eliminates the need for customer oxygen out-diffusion and nucleation
| - Improved customer cost of ownership through cycle time reduction
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| - Ease of transition from 200 to 300 mm
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