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Standard CMOS Epi
Aegis™
Overview
Description
Characteristics
Features & Benefits
Power/Discrete Epi
Custom Epi

Aegis™
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Application Note 3/00
Aegis™ Snapshot
Aegis™ -- Features & Benefits
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The AEGIS™ Advantage

  • A long term silicon solution that will deliver yield and device performance as you transition to advanced device processes.

  • A cost effective advanced product that will perform well across your entire range of device technologies.

  • The opportunity to improve your total cost of ownership through elimination of furnace steps early in the fab process.

  • AEGIS™ will be competitively priced based on the evolving market conditions, the value this product provides, and the services provided by MEMC.

Features
Benefits
  • Epi p/p- product provides a defect-free layer for device fabrication

  • Cost effective replacement for N-doped epi, annealed or advanced polished wafers offering the advantages of a mature technology
  • No harmful crystal defects in the epi layer

  • No crystal-defect related yields and reliability degradation
  • Deep precipitate-free zone maintained throughout customer processing

  • Improved device yield and reliability potential by eliminating all oxygen precipitates in device layer
  • Deep precipitate-free zone maintained throughout customer processing

  • Improved device yield and reliability potential by eliminating all oxygen precipitates in device layer
  • Robust IG protection through MDZ®

  • Insurance against device yield upsets caused by metallic contamination
  • Build-in IG template through MDZ® eliminates the need for customer oxygen out-diffusion and nucleation

  • Improved customer cost of ownership through cycle time reduction
  • Scalable to 300mm
  • Ease of transition from 200 to 300 mm

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